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Electrical gating and rectification in graphene three-terminal junctionsHÄNDEL, B; HÄHNLEIN, B; GÖCKERITZ, R et al.Applied surface science. 2014, Vol 291, pp 87-92, issn 0169-4332, 6 p.Conference Paper

Signal mixing in a ratchet device: commensurability and current controlSAVEL'EV, Sergey; MARCHESONI, Fabio; HÄNGGI, Peter et al.The European physical journal. B, Condensed matter physics. 2004, Vol 40, Num 4, pp 403-408, issn 1434-6028, 6 p.Article

ETUDE DE L'EFFET REDRESSEUR DU COUPLE ZNO OBTENU PAR LES ZNS, ZNSO3 ET NI2O3 TRAITES THERMIQUEMENTSPASOVA E.1973; GOD. VISSH. TECKH. UCHEBN. ZAVED., FIZ.; BALG.; DA. 1973 PARU 1975; VOL. 10; NO 2; PP. 79-82; ABS. RUSSE ANGL.; BIBL. 5 REF.Article

Current transport characteristics of pSe-nMoSe2 heterojunction diodeSUMESH, C. K; PATEL, K. D; PATHAK, V. M et al.EPJ. Applied physics (Print). 2010, Vol 52, Num 3, issn 1286-0042, 30302.p1-30302.p4Article

Exploring the performance of molecular rectifiers : Limitations and factors affecting molecular rectificationARMSTRONG, Nicholas; HOFT, Rainer C; MCDONAGH, Andrew et al.Nano letters (Print). 2007, Vol 7, Num 10, pp 3018-3022, issn 1530-6984, 5 p.Article

Superconducting rectifier based on the asymmetric surface barrier effectVODOLAZOV, D. Y; PEELERS, F. M.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 17, pp 172508.1-172508.4, issn 1098-0121Article

Do alkyl tunnelling barriers contribute to molecular rectification?ASHWELL, Geoffrey J; STOKES, Robert J.Journal of material chemistry. 2004, Vol 14, Num 8, pp 1228-1230, issn 0959-9428, 3 p.Article

Effets redresseurs des couches d'inversion 2D dans un champ magnétique parallèleFAL'KO, V. I.Fizika tverdogo tela. 1989, Vol 31, Num 4, pp 29-32, issn 0367-3294Article

MICROWAVE INTERFERENCE EFFECT IN BIPOLAR TRANSISTORS.RICHARDSON RE; PUGLIELLI VG; AMADORI RA et al.1975; I.E.E.E. TRANS. ELECTROMAGN. COMPATIB.; U.S.A.; DA. 1975; VOL. 17; NO 4; PP. 216-219; BIBL. 2 REF.Article

Enormously Enhanced Rectifying Performances by Modification of Carbon Chains for D―σ―A Molecular DevicesGUO, C; ZHANG, Z. H; KWONG, G et al.Journal of physical chemistry. C. 2012, Vol 116, Num 23, pp 12900-12905, issn 1932-7447, 6 p.Article

Negative incremental resistance induced by calcium in asymmetric nanoporesSIWY, Zuzanna S; POWELL, Matthew R; KALMAN, Eric et al.Nano letters (Print). 2006, Vol 6, Num 3, pp 473-477, issn 1530-6984, 5 p.Article

Symmetry and environment effects on rectification mechanisms in quantum pumpsARRACHEA, Liliana.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 12, pp 121306.1-121306.4, issn 1098-0121Article

Reducing standby power applied to SR forward converters with transient load response consideredYAU, Y. T; HWU, K. I; CHOU, Yung-Shan et al.MWSCAS : Midwest symposium on circuits and systems. 2004, isbn 0-7803-8346-X, 3Vol, Vol II, 313-316Conference Paper

Microdiffusers as dynamic passive valves for micropump applicationsGERLACH, T.Sensors and actuators. A, Physical. 1998, Vol 69, Num 2, pp 181-191, issn 0924-4247Article

Rectification properties of geometrically asymmetric metal-vacuum-metal junctions: a comparison of tungsten and silver tips to determine the effects of polarization resonancesMAYER, A; CUTLER, P. H.Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 39, issn 0953-8984, 395304.1-395304.7Article

HOMOJUNCTION FABRICATION IN CUINSE2 BY COPPER DIFFUSION.TOMLINSON RD; ELLIOTT E; PARKES J et al.1975; APPL. PHYS. LETTERS; U.S.A.; DA. 1975; VOL. 26; NO 7; PP. 383; BIBL. 4 REF.Article

DIE FRITTUNG RUHENDER KONTAKTE ALS HALBLEITER-ERSCHEINUNG = LA COMPRESSION DE CONTACTS AU REPOS CREE DES EFFETS DE SEMICONDUCTEURKUCZOGI E.1972; ELEKTROTECH. Z., A; DTSCH.; DA. 1972; VOL. 93; NO 8; PP. 465-467Serial Issue

CARACTERISTIQUES ELECTRIQUES D'UN INTERVALLE DE DECHARGE REMPLI PAR UN JET DE PLASMANIKOLAEV AV.1972; FIZ. KHIM. OBRABOT. MATER.; S.S.S.R.; DA. 1972; NO 6; PP. 42-46; BIBL. 9 REF.Serial Issue

INFLUENCE DE L'IMPURETE CADMIUM DANS LES COUCHES DE SULFURE DE CUIVRE SUR L'EFFET PHOTOREDRESSEUR DES HETEROJONCTIONS CU2-XSP-CDSPKANTARIYA RV; PAVELETS S YU; FEDORUS GA et al.1980; UKR. FIZ. Z. (KIEV, 1967); ISSN 0503-1265; UKR; DA. 1980; VOL. 25; NO 11; PP. 1806-1809; ABS. ENG; BIBL. 6 REF.Article

SUR LA THEORIE DE LA CARACTERISTIQUE COURANT-TENSION D'UN CONTACT METAL-COUCHE MINCE SEMICONDUCTRICESTRIKHA VI; SHEKA DI.1972; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1972; NO 7; PP. 105-110; BIBL. 4 REF.Serial Issue

Electronic transport for graphene/n-type Si Schottky diodes with and without H2O2 treatmentLIN, Jian-Huang; ZENG, Jian-Jhou; LIN, Yow-Jon et al.Thin solid films. 2014, Vol 550, pp 582-586, issn 0040-6090, 5 p.Article

Macroscopic coherent rectification in Andreev interferometersMEAIR, Jonathan; JACQUOD, Philippe.Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 27, issn 0953-8984, 272201.1-272201.5Article

A theory of redox-mediated electron tunneling through an electrochemical two-center contact : The conductivity of single molecules and supramolecular architecturesKUZNETSOV, Alexander M; MEDVEDEV, Igor G.Journal of physics. Condensed matter (Print). 2008, Vol 20, Num 37, issn 0953-8984, 374112.1-374112.14Article

Unipolar rectifying silicon nanowires-TCAD studyFOBELETS, K; VELAZQUEZ-PEREZ, J. E.Physica. E, low-dimentional systems and nanostructures. 2008, Vol 40, Num 7, pp 2481-2484, issn 1386-9477, 4 p.Conference Paper

Local neutron transmutation doping using isotopically enriched silicon filmYAMADA, Yoichi; YAMAMOTO, Hiroyuki; OHBA, Hironori et al.The Journal of physics and chemistry of solids. 2007, Vol 68, Num 11, pp 2204-2208, issn 0022-3697, 5 p.Conference Paper

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